- Various addressing patterns: increasing, decreasing, random, and more
- Basic tests: read, seek, write, create & fill
- Compound tests: copy, compare, update, refresh, and more
- Stress tests: using all addressing patterns
- Test area selection: by size, percent, region, stripes, or combinations thereof
- Test duration control: by elapsed time, alarm-clock, transfer-count or -size
- Choice of measure units in powers of 1000 or 1024
- Entropy control for random addressing
- Extra options: synchronous output, pattern-fill, faster algorythms, and more
- Free and Open Source Software (FOSS) licensed with GPLv3 and hosted by SourceForge
- Runs on AIX, Solaris, HP-UX, GNU Linux, BSD Operating Systems, and CygWin
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